The Supply Chain Behind Advanced AI Chips

How a chip becomes a working accelerator: the design tools, materials, manufacturing equipment, fabs, memory, packaging, and testing behind AI compute, and the companies that supply each layer.

Logic dieThe model’s arithmeticMemory stacksWeights + activations nearbyInterposerDense connectionsPackage substratePower + connection to the board
Logic die
The model’s arithmetic
Memory stacks
Weights + activations nearby
Interposer
Dense connections
Package substrate
Power + connection to the board
Logic and memory meet on an interposer above a package substrate. Connections, power, and heat must all work together. Schematic; not to scale.

What the record shows

  • Design is only the beginning. NVIDIA and AMD rely on external foundries, memory suppliers, and packaging processes to turn their designs into physical products.
  • Memory and packaging are part of the computing system. HBM stacks sit beside logic dies, and the connections between them determine how quickly data can reach the processor.
  • A fab is a chain of specialized processes. Materials, deposition, lithography, etching, and inspection must work together to produce usable dies.
  • Capacity must be qualified, not just announced. The manufacturing-project records distinguish planned facilities, construction, and operating capacity.

How the system fits together

An accelerator starts as a description of the calculations it needs to perform. Design software turns that description into a physical layout; materials and manufacturing equipment turn the layout into patterns on a silicon wafer. The wafer is cut into individual chips, or dies, which are combined with memory in a package and tested before installation in a server.

The eight sections below follow that sequence. Each explains what the layer does, shows its parts, and connects it to the companies supplying it. The finished accelerator then enters the racks and clusters described in The Physical Stack Behind AI.

Table of contents
Part I

Design the chip

Software tools and chip architecture turn a workload into a manufacturable design.

01EDA & IP

Before a chip can be manufactured, engineers need a precise description of what it should do and where every part should go. Electronic design automation (EDA) software turns that description into a physical layout and checks that it will work. Reusable intellectual property (IP), such as processor cores and interface designs, supplies building blocks that do not have to be designed from scratch. The result is a verified design ready to hand to a manufacturer.

01 Logical intentArchitecture + reusable IP02 ImplementationSynthesis + place and route03 Verified layoutTiming, power, signoff
01 Logical intent
Architecture + reusable IP
02 Implementation
Synthesis + place and route
03 Verified layout
Timing, power, signoff
Design tools turn logical intent into a verified physical layout. Errors found here can avoid another manufacturing cycle. Schematic; not to scale.
Schematic · not to scale
1 / 5

Architecture + RTL

System requirements are partitioned into compute, memory, I/O, control, and security blocks, then expressed as hardware behavior in RTL.

Synopsys ↗

From RTL to a manufacturable layout

Synopsys' official EDA overview connects logic synthesis, digital place-and-route, verification, validation, and silicon correlation. The important economic point is the iteration loop: errors caught in software avoid a mask re-spin and lost fab time.

Synopsys ↗

What's inside: 5 components and their sources
Architecture + RTLengineer-month · design block

System requirements are partitioned into compute, memory, I/O, control, and security blocks, then expressed as hardware behavior in RTL.

What to watch. Watch whether the architecture can meet bandwidth and power targets before implementation complexity hardens.

Input: workload + constraintsOutput: RTL + block planSynopsys ↗

Reusable IPlicense · royalty · instantiated block

Processor cores, memory controllers, SerDes, PCIe, die-to-die links, and standard-cell libraries let design teams reuse silicon-proven functions instead of rebuilding every interface.

What to watch. Foundry-node qualification, interface standards, and verification collateral determine whether reusable IP actually shortens the schedule.

Examples: CPU · SerDes · PHYGate: node qualificationTSMC ↗

Logic synthesissynthesis run · compute hour

Synthesis converts RTL into a gate-level netlist using foundry libraries while optimizing for timing, power, area, and testability.

What to watch. Constraint quality matters: a netlist can be logically correct yet impossible to close physically at the target clock or power envelope.

Input: RTL + librariesOutput: gate netlistSynopsys ↗

Place + routedesign iteration · EDA compute

Billions of gates are positioned and their metal connections routed while tools resolve congestion, clocking, power delivery, thermal density, and design rules.

What to watch. Routing congestion and timing violations often force architectural or floorplan changes late in the cycle, when delay is expensive.

Optimizes: power · performance · areaOutput: physical layoutSynopsys ↗

Verification + signoffverification cycle · coverage target

Simulation, formal checks, timing analysis, power analysis, and layout-versus-schematic checks establish that the implemented design behaves as intended and can be manufactured.

What to watch. Coverage gaps and late-found violations create re-spins. First-pass silicon is a schedule and capital event, not only a technical milestone.

Checks: function · timing · powerDecision: tape-outSynopsys ↗

Market participants3 companies

Select a company for its roles, financials, relationships, and primary sources. Figures are company-wide USD for the fiscal year shown, not revenue attributable to this layer. Missing values are not reported.

CompanyRole in this layerRevenueCapexPP&E, net
ARM · FY2026CPU, GPU, interconnect, and system IP licensed to chip designers$4.9B$545.0M$772.0M
CDNS · FY2025Digital, custom, system, and packaging design software plus reusable IP$5.3B$141.9M$517.0M
SNPS · FY2025Design, verification, silicon IP, and interface IP used before tape-out$7.1B$169.5M$696.7M

02Chip & network design

A chip designer decides how the accelerator will divide its work between arithmetic, memory, and communication. More computing units help only if data can reach them quickly enough. The design therefore includes memory controllers and the links that let processors exchange results. This is why the accelerator, the network, and the software that coordinates them need to be designed together. The finished design still depends on a foundry to manufacture it.

Parallel computeRepeated arithmetic blocksInterconnectMove data between devicesMemory interfacesKeep the processor supplied
Parallel compute
Repeated arithmetic blocks
Interconnect
Move data between devices
Memory interfaces
Keep the processor supplied
Compute blocks share a die with memory interfaces and interconnect. Data movement is part of the architecture. Schematic; not to scale.
Schematic · not to scale
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Compute engines

Tensor, vector, scalar, and control engines execute the model while cache and scheduling logic try to keep the datapaths occupied.

NVIDIA ↗

GB300 NVL72: one design spans die, link, switch, and rack

NVIDIA documents fifth-generation NVLink at up to 1,800 GB/s per GPU and a 72-GPU rack domain. That is the architectural lesson: accelerator silicon and network silicon are co-designed as one performance envelope.

NVIDIA ↗

What's inside: 5 components and their sources
Compute enginesaccelerator · FLOPS · tokens/s

Tensor, vector, scalar, and control engines execute the model while cache and scheduling logic try to keep the datapaths occupied.

What to watch. Compare delivered workload throughput and utilization, not incompatible peak-precision claims.

Unit: acceleratorOutcome: useful throughputNVIDIA ↗

Memory controllersGB/s · TB/s · pJ/bit

HBM controllers and PHYs move weights, activations, and key-value cache between stacked memory and the compute die over a very wide interface.

What to watch. Capacity, bandwidth, and energy per bit can each become the binding constraint for a different model or serving regime.

Path: HBM ↔ computeWatch: bandwidth utilizationMicron Technology ↗

Scale-up fabricGB/s per GPU · domain size

High-bandwidth links and switch silicon join GPUs within a server or rack so collective operations can treat the domain as a tightly coupled compute unit.

What to watch. Topology, oversubscription, latency, and collective efficiency determine how much of link bandwidth becomes model throughput.

Blackwell NVLink: 1,800 GB/s per GPUDomain: up to 72 GPUsNVIDIA ↗

Scale-out fabricGb/s per port · radix · network tier

NICs, DPUs, Ethernet or InfiniBand switches, optics, and routing connect accelerator domains to one another and to storage.

What to watch. Tail latency, congestion control, optical reach, and failure domains become more important as cluster size grows.

Traffic: east/west collectivesBoundary: rack → clusterNVIDIA ↗

Collectives + controljob goodput · availability

Drivers, communication libraries, topology discovery, and switch control turn physical links into usable all-reduce, broadcast, partitioning, and fault recovery.

What to watch. A fast fabric with poor topology awareness or resiliency strands accelerator time. Watch delivered job completion, not link rate alone.

Operations: reduce · broadcastOutcome: cluster goodputNVIDIA ↗

Market participants6 companies

Select a company for its roles, financials, relationships, and primary sources. Figures are company-wide USD for the fiscal year shown, not revenue attributable to this layer. Missing values are not reported.

CompanyRole in this layerRevenueCapexPP&E, net
AMD · FY2025EPYC CPUs, Instinct accelerators, adaptive SoCs, and interconnect$34.6B$974.0M$2.3B
AVGO · FY2025Ethernet switch silicon, optical components, and custom AI accelerators$63.9B$623.0M$2.5B
MRVL · FY2026Custom compute, electro-optics, switching, and interconnect silicon$8.2B$354.1M$935.0M
2454Mobile, edge-AI, networking, and connectivity systems-on-chipNot reportedNot reportedNot reported
NVDA · FY2026GPU accelerators, NVLink, networking, and rack-scale systems$215.9BNot reported$10.4B
QCOM · FY2025Snapdragon compute, radio-frequency, modem, and connectivity platforms$44.3BNot reported$4.7B
Part II

Manufacture the silicon

Materials, equipment, and fabrication turn that design into working dies, one process layer at a time.

03Materials

A chip starts with a flat, polished slice of silicon called a wafer. Making circuits on that surface requires more than silicon: light-sensitive coatings define patterns, gases and chemicals add or remove films, and polishing materials keep the surface level. These materials are used repeatedly as the chip is built. Tiny particles or variations can spoil a circuit, so purity and consistency matter as much as the quantity delivered.

Process materialsGases, resists, precursorsPolished siliconThe surface every layer depends onPurity is a manufacturing constraintContamination can turn a good design into a failed die
Process materials
Gases, resists, precursors
Polished silicon
The surface every layer depends on
Purity is a manufacturing constraint
Contamination can turn a good design into a failed die
A polished silicon wafer is the starting surface. Resists, gases, and other process materials build and pattern its layers. Schematic; not to scale.
Schematic · not to scale
1 / 5

Single-crystal ingot

Electronic-grade polysilicon is melted and a single-crystal ingot is pulled so the wafer begins with a controlled atomic structure and resistivity.

SUMCO ↗

A polished wafer already contains a supply chain

SUMCO shows five controlled wafer-forming stages after crystal growth—slicing, lapping, etching, polishing, then cleaning and inspection. The fab buys a precisely qualified surface, not a generic disc of silicon.

SUMCO ↗

What's inside: 5 components and their sources
Single-crystal ingotkilogram · ingot · crystal yield

Electronic-grade polysilicon is melted and a single-crystal ingot is pulled so the wafer begins with a controlled atomic structure and resistivity.

What to watch. Crystal defects and resistivity variation propagate through every later process; qualification cycles make supplier changes slow.

Method: CZ crystal growthOutput: monocrystalline ingotSUMCO ↗

Prime silicon wafer300 mm wafer · flatness · particles

The ingot is sliced, lapped, chemically etched, polished to a mirror finish, cleaned, and inspected before it can enter a leading-edge fab.

What to watch. Bow, warp, surface particles, and crystal defects affect focus, overlay, and downstream yield.

Forming steps: 5Finish: mirror-polishedSUMCO ↗

Resist + mask materialswafer pass · reticle · liters of chemical

Photoresist changes chemically under exposure while reticles carry the pattern. Developers, underlayers, pellicles, and cleaning materials support each lithography cycle.

What to watch. Stochastic defects, line-edge roughness, shelf life, and contamination determine whether the printed pattern survives transfer.

Role: light → patternLoop: coat · expose · developASML ↗

Gases + precursorscylinder · kilogram · wafer pass

Ultra-high-purity precursors create conductive, insulating, and semiconductor films; reactive gases selectively remove material during etch.

What to watch. Purity, delivery stability, chamber compatibility, and residue control affect film uniformity and device reliability.

Deposition: ALD · CVD filmsRisk: particles · metals · organicsEntegris ↗

Filtration + handlingparticles per volume · filter life

Filters, purifiers, wafer carriers, coatings, and cleanroom systems keep particles and trace metals out of materials and process chambers.

What to watch. At advanced geometries, contaminants smaller than a visible speck can kill a die; monitor purity at delivery and at point of use.

Control: filter · purify · containOutcome: fewer defectsEntegris ↗

Market participants10 companies

Select a company for its roles, financials, relationships, and primary sources. Figures are company-wide USD for the fiscal year shown, not revenue attributable to this layer. Missing values are not reported.

CompanyRole in this layerRevenueCapexPP&E, net
AICarrier, specialty, and advanced-material gases for semiconductor productionNot reportedNot reportedNot reported
COHR · FY2026Silicon carbide substrates, lasers, and optical components$7.1B$1.1B$3.0B
DD · FY2025Photoresists, dielectric materials, chemical-mechanical planarization, and packaging materials$6.8BNot reportedNot reported
ENTG · FY2025Specialty materials, gas delivery, filtration, and wafer handling$3.2B$299.2M$1.6B
6488Silicon, silicon-on-insulator, and compound-semiconductor wafersNot reportedNot reportedNot reported
LIN · FY2025Ultra-high-purity bulk and specialty gases for fabs$34.0B$5.3B$28.3B
MRKDeposition materials, patterning materials, specialty gases, and planarization productsNot reportedNot reportedNot reported
4063300 mm silicon wafers and lithography materialsNot reportedNot reportedNot reported
SOISilicon-on-insulator and engineered substratesNot reportedNot reportedNot reported
3436Polished, epitaxial, and advanced-node 300 mm silicon wafersNot reportedNot reportedNot reported

04Wafer-fab equipment

Manufacturing equipment turns the chip layout into physical structures on a wafer. Deposition tools add thin films. Lithography transfers a pattern into a light-sensitive coating. Etching removes selected material, leaving the desired structure behind. Cleaning, polishing, and measurement keep the process under control. A wafer passes through these operations repeatedly to build the transistors and the wiring that connects them.

Add a filmDepositionExpose a patternLithographyRemove materialEtch + cleanInspect, measure, repeat across many layers
Add a film
Deposition
Expose a pattern
Lithography
Remove material
Etch + clean
Deposition adds a film, lithography defines a pattern, and etching removes material. Inspection feeds corrections back into the process. Schematic; not to scale.
Schematic · not to scale
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Deposition

CVD, PVD, and ALD tools deposit conductors, insulators, and semiconductor films with atomic-scale thickness and uniformity control.

ASML ↗

One layer is a loop; a chip can repeat it up to 100 times

ASML's manufacturing explainer traces deposition, photoresist, exposure, development, etch, implantation, resist removal, and measurement. Repetition makes uptime, repeatability, and process-control feedback central to fab output.

ASML ↗

What's inside: 5 components and their sources
Depositionwafer pass · film thickness · wafers/hour

CVD, PVD, and ALD tools deposit conductors, insulators, and semiconductor films with atomic-scale thickness and uniformity control.

What to watch. Uniformity, precursor use, chamber matching, and particle generation determine whether the next patterning step starts from a stable film.

Action: add a thin filmControl: thickness + uniformityASML ↗

Lithographywafer pass · wafer/hour · overlay

DUV and EUV scanners project a reticle pattern onto photoresist. Resolution, overlay, focus, source power, and tool availability set the patterning envelope.

What to watch. Critical layers depend on scarce, complex systems. Throughput and uptime can matter as much as nominal resolution.

Critical input: light + reticleOutput: patterned resistASML ↗

Etch + cleanwafer pass · selectivity · etch rate

Plasma and wet processes remove exposed material while preserving masked regions; cleans strip residue before the next layer.

What to watch. Profile control, chamber condition, residues, and damage are tightly coupled to yield on dense three-dimensional structures.

Action: remove exposed materialRisk: profile + residueASML ↗

Implant + planarizedose · wafer pass · removal rate

Ion implantation changes electrical properties; chemical-mechanical polishing flattens the surface so another precisely aligned layer can be built.

What to watch. Dose uniformity and surface planarity must stay within a shrinking process window across the full wafer.

Implant: tune conductivityCMP: restore flatnessASML ↗

Metrology + inspectioninspection pass · sampling rate · defect density

Optical and electron-beam systems measure dimensions and overlay, find defects, and classify excursions so recipes or tools can be corrected before more value is added.

What to watch. Sensitivity competes with throughput. Sampling plans must find systematic defects without turning process control into the line bottleneck.

Inspection: find defectsMetrology: measure precisionFeedback: recipe correctionKLA ↗

Market participants11 companies

Select a company for its roles, financials, relationships, and primary sources. Figures are company-wide USD for the fiscal year shown, not revenue attributable to this layer. Missing values are not reported.

CompanyRole in this layerRevenueCapexPP&E, net
6857System-on-chip and memory automated test systemsNot reportedNot reportedNot reported
AMAT · FY2025Deposition, etch, ion implant, metrology, and packaging equipment$28.4B$2.3B$4.6B
ASMSingle-wafer ALD, epitaxy, and vertical furnace systemsNot reportedNot reportedNot reported
ASML / ASML · FY2025EUV, High-NA EUV, DUV lithography, metrology, and computational lithographyNot reportedNot reportedNot reported
BESIDie attach, hybrid bonding, molding, plating, and trim/form systemsNot reportedNot reportedNot reported
6146Grinding, polishing, laser saw, and dicing systemsNot reportedNot reportedNot reported
KLAC · FY2026Inspection, metrology, computational analytics, and process-control systems$13.6B$375.9M$1.4B
LRCX · FY2026Plasma etch, deposition, wafer clean, and advanced packaging equipment$23.2BNot reported$2.9B
7735Single-wafer cleaning, batch cleaning, coater/developer, and annealing systemsNot reportedNot reportedNot reported
TER · FY2025System-on-chip, memory, storage, and wireless test platforms$3.2B$224.0M$563.0M
8035Coater/developer, thermal processing, etch, deposition, and wafer cleaningNot reportedNot reportedNot reported

05Foundries & IDMs

A foundry operates the factories that manufacture chips for other companies. An integrated device manufacturer (IDM) also designs its own chips. Both must turn a working process into repeatable production: the same design appears many times across a wafer, but not every copy will work. The share of usable chips is called yield. Factory capacity becomes useful supply only when the process produces enough good chips and customers have qualified them.

One wafer, many copiesEach rectangle represents a dieUsable dieYield determines outputUsableRejected · illustrative, not a yield estimate
One wafer, many copies
Each rectangle represents a die
Usable die
Yield determines output
The same design is repeated across a wafer. Process control and yield determine how many usable dies emerge. Schematic; not to scale.
Schematic · not to scale
1 / 5

Tape-out + masks

The signed-off layout is fractured into mask data and checked against foundry rules before production reticles are released.

TSMC ↗

TSMC Arizona Fab 1: operation is a state, not an announcement

The NIST project record distinguishes construction, production milestones, technology scope, and program commitments. Semiconductor capacity becomes economically relevant only after tools, process, yield, and customer qualification converge.

National Institute of Standards and Technology ↗

What's inside: 5 components and their sources
Tape-out + masksmask set · tape-out · NRE

The signed-off layout is fractured into mask data and checked against foundry rules before production reticles are released.

What to watch. Mask cost and queue time make late design changes expensive; first-pass success protects both schedule and wafer capacity.

Input: verified layoutRelease: mask setTSMC ↗

Wafer startswafer starts/month · lot

A wafer lot is introduced to the line and routed through the qualified process flow, repeatedly visiting tool groups over months.

What to watch. Announced shell capacity is not the same as installed, qualified, and customer-allocated wafer starts.

Unit: 300 mm wafer startState: installed → qualifiedASML ↗

Process integrationprocess node · design rule · recipe

Transistor, interconnect, patterning, materials, and thermal steps must work as one reproducible process rather than as isolated tool recipes.

What to watch. A nominal node label does not reveal performance, density, yield, or customer readiness; watch qualified products and volume state.

Scope: transistor → interconnectArtifact: qualified flowTSMC ↗

Yield learninggood die/wafer · defect density

Inspection, electrical test, failure analysis, and statistical process control identify defect mechanisms and raise the share of dies that meet specification.

What to watch. Yield on a large accelerator die can dominate delivered cost and volume. Early ramps should not be treated like mature output.

Input: patterned waferOutput: good dieKLA ↗

Qualification + rampqualified product · ramp quarter

Process reliability, package interaction, product test, and customer signoff convert engineering lots into repeatable high-volume shipments.

What to watch. Expected operation dates, risk production, qualification, and volume production are different milestones and should remain distinct.

Milestones: risk → qualify → volumeEvidence: company + governmentNational Institute of Standards and Technology ↗

Market participants15 companies

Select a company for its roles, financials, relationships, and primary sources. Figures are company-wide USD for the fiscal year shown, not revenue attributable to this layer. Missing values are not reported.

CompanyRole in this layerRevenueCapexPP&E, net
GFS · FY2025Radio-frequency, silicon photonics, power, embedded memory, and mature-node logicNot reportedNot reportedNot reported
688347 / 1347Embedded non-volatile memory, power, analog, and mature-node logicNot reportedNot reportedNot reported
IFXSilicon carbide, gallium nitride, power, automotive, and microcontroller productsNot reportedNot reportedNot reported
INTC · FY2025CPUs, accelerators, Intel 18A process, and foundry services$52.9B$14.6BNot reported
MCHP · FY2026Microcontrollers, field-programmable gate arrays, analog, timing, and connectivity$4.7B$91.1M$1.1B
NXPI · FY2025Automotive processors, microcontrollers, radio-frequency, and secure connectivity$12.3B$397.0M$3.0B
ON · FY2025Silicon carbide, power management, and intelligent sensing$6.0B$341.2M$3.4B
6723Microcontrollers, system-on-chip, analog, and power productsNot reportedNot reportedNot reported
005930Leading-edge logic, foundry services, image sensors, and memoryNot reportedNot reportedNot reported
688981 / 0981Logic and specialty wafer manufacturing across multiple process generationsNot reportedNot reportedNot reported
STM / STMPA · FY2025Silicon carbide, microcontrollers, sensors, analog, and automotive semiconductors$11.8BNot reported$11.1B
TXN · FY2025Analog, power-management, and embedded-processing semiconductors$17.7B$4.6B$12.3B
TSEM / TSEM · FY2025Radio-frequency, power, image-sensor, silicon-photonics, and analog processes$1.6B$444.4M$1.5B
2330 / TSM · FY2024N2, A16, N3, N4/N5, specialty processes, and wafer manufacturingNot reportedNot reportedNot reported
2303 / UMC · FY2024Logic and specialty technologies across 300 mm and 200 mm fabsNot reportedNot reportedNot reported
Part III

Assemble the package

Memory, advanced packaging, and testing turn individual dies into a qualified computing component.

06HBM & memory

An AI processor needs a steady supply of model weights and other data. High-bandwidth memory (HBM) puts several memory dies in a vertical stack beside the processor, with many parallel connections carrying data between them. Connections pass through the silicon itself using through-silicon vias, or TSVs. Stacking brings memory close to compute, but every die and connection must work, and heat must still escape from the finished package.

Memory diesStack capacity verticallyVertical connectionsThrough-silicon vias + microbumpsBase + package interfaceMove data into the processor
Memory dies
Stack capacity vertically
Vertical connections
Through-silicon vias + microbumps
Base + package interface
Move data into the processor
High-bandwidth memory stacks connect memory dies vertically and sit beside the processor in the finished package. Schematic; not to scale.
Schematic · not to scale
1 / 5

DRAM dies

Multiple DRAM dies supply the capacity and parallel channels. Each layer must be tested because one weak die can compromise the stack.

Micron Technology ↗

Micron HBM3E: bandwidth comes from width, proximity, and stacking

Micron describes a 1,024-bit interface with 32 independent channels and more than 1.2 TB/s per HBM3E stack. The commercial unit is a qualified stack that must arrive with the package—not a commodity DRAM bit in isolation.

Micron Technology ↗

What's inside: 5 components and their sources
DRAM diesgigabit die · known-good die

Multiple DRAM dies supply the capacity and parallel channels. Each layer must be tested because one weak die can compromise the stack.

What to watch. Bit density, process yield, speed grade, and power all affect how many stackable dies emerge from a wafer.

Role: store model stateGate: known-good dieMicron Technology ↗

TSVs + microbumpsvia · microbump · bond pitch

Thousands of vertical vias and fine-pitch bonds carry data, power, and control through the stack over much shorter paths than a conventional module.

What to watch. Via defects, bond alignment, and thermal stress compound across stacked dies.

Direction: verticalScale: thousands of TSVsMicron Technology ↗

Base die + channelschannel · I/O width

An optional base die and channel architecture organize the ultra-wide interface and connect the stack to package routing.

What to watch. Controller compatibility and channel utilization determine whether headline bandwidth is reachable by the workload.

Micron example: 32 channelsInterface: 1,024 bitsMicron Technology ↗

Vertical stackstack height · GB/stack

Eight-high or twelve-high assemblies trade stack height and packaging complexity for more capacity without stretching the package laterally like conventional DIMMs.

What to watch. More layers increase capacity but tighten bonding, warpage, thermal, and known-good-die requirements.

Form: 3D-stacked SDRAMOutcome: capacity + bandwidthMicron Technology ↗

Interposer interfaceTB/s per stack · pJ/bit

The stack sits beside the CPU or GPU on a silicon or redistribution-layer interposer, shortening the path and enabling a very wide parallel connection.

What to watch. Package routing, signal integrity, and thermals bind memory supply to advanced-packaging capacity.

HBM3E example: >1.2 TB/s per stackPlacement: beside computeMicron Technology ↗

Market participants4 companies

Select a company for its roles, financials, relationships, and primary sources. Figures are company-wide USD for the fiscal year shown, not revenue attributable to this layer. Missing values are not reported.

CompanyRole in this layerRevenueCapexPP&E, net
285ANAND flash and solid-state storage; not a current HBM supplierNot reportedNot reportedNot reported
MU · FY2025HBM, DDR, NAND, managed storage, and advanced memory packaging$37.4B$15.9BNot reported
005930HBM, DDR, NAND, and enterprise storageNot reportedNot reportedNot reported
000660HBM, DDR, NAND, and enterprise storageNot reportedNot reportedNot reported

07Advanced packaging

Packaging connects the processor and memory into a component that can be installed on a circuit board. In an advanced AI package, logic dies and HBM stacks sit on a dense wiring layer called an interposer. Beneath it, a substrate connects the assembly to the board and supplies power. Packaging is therefore part of the system design: its wiring, size, power delivery, and cooling interface affect what the chips can do together.

Logic dieThe model’s arithmeticMemory stacksWeights + activations nearbyInterposerDense connectionsPackage substratePower + connection to the board
Logic die
The model’s arithmetic
Memory stacks
Weights + activations nearby
Interposer
Dense connections
Package substrate
Power + connection to the board
Logic and memory meet on an interposer above a package substrate. Connections, power, and heat must all work together. Schematic; not to scale.
Schematic · not to scale
1 / 5

Logic die + chiplets

One or more advanced-node dies provide compute and I/O. Partitioning can improve design reuse and die yield but adds die-to-die interfaces and package dependencies.

TSMC ↗

CoWoS turns a package into a compute platform

TSMC describes CoWoS as a 2.5D platform integrating multiple SoCs and HBM stacks. CoWoS-S supports interposers up to 3.3 times reticle size, showing how package integration expands the system beyond a single-die boundary.

TSMC ↗

What's inside: 5 components and their sources
Logic die + chipletsknown-good die · chiplet

One or more advanced-node dies provide compute and I/O. Partitioning can improve design reuse and die yield but adds die-to-die interfaces and package dependencies.

What to watch. A smaller die can yield better than a monolith, but the package succeeds only if every bonded die and interface works.

Choice: monolith ↔ chipletsGate: known-good dieTSMC ↗

HBM stacksstack · GB · TB/s

Several HBM cubes are placed close to logic so thousands of signal paths can run across the interposer at high bandwidth and lower energy per bit.

What to watch. HBM availability and package slots jointly limit how many complete accelerators can ship.

Role: capacity + bandwidthDependency: memory + packageTSMC ↗

Interposer + RDLmm² · reticle multiple · routing pitch

Silicon or redistribution-layer interposers connect logic, HBM, and package bumps with fine-pitch routing beyond what an ordinary substrate can provide.

What to watch. Interposer area, mask stitching, defect exposure, and routing density determine package scale and yield.

CoWoS-S: up to 3.3× reticleExample area: about 2,700 mm²TSMC ↗

Organic substratesubstrate · layers · package size

The substrate fans dense package connections out to the circuit board while carrying power, ground, and high-speed signals across materials with different expansion rates.

What to watch. Substrate availability, layer count, via density, and coefficient-of-thermal-expansion mismatch affect both capacity and reliability.

Function: fan-out + powerBoundary: interposer → boardTSMC ↗

Power + thermal pathwatts/package · thermal resistance

Bumps, capacitors, lid, thermal interface, and package mechanics must deliver stable power and remove heat without cracking bonds or warping the assembly.

What to watch. Higher package power raises coupling between electrical design, cooling, materials, and long-term reliability.

Input: high currentOutput: heat to cold plateTSMC ↗

Market participants10 companies

Select a company for its roles, financials, relationships, and primary sources. Figures are company-wide USD for the fiscal year shown, not revenue attributable to this layer. Missing values are not reported.

CompanyRole in this layerRevenueCapexPP&E, net
AMKR · FY2025Flip-chip, wafer-level, system-in-package, and 2.5D packaging$6.7B$904.6MNot reported
3711 / ASX · FY20252.5D/3D integration, fan-out, flip-chip, and system-in-packageNot reportedNot reportedNot reported
4062Build-up substrates for high-performance processors and advanced packagesNot reportedNot reportedNot reported
INTC · FY2025EMIB, Foveros, and glass-substrate development$52.9B$14.6BNot reported
600584Wafer-level, flip-chip, system-in-package, and heterogeneous integrationNot reportedNot reportedNot reported
8046Flip-chip ball-grid-array substrates and high-density printed circuit boardsNot reportedNot reportedNot reported
0059302.5D/3D integration and foundry packagingNot reportedNot reportedNot reported
000660Through-silicon-via HBM assembly and next-generation memory packagingNot reportedNot reportedNot reported
2330 / TSM · FY2024CoWoS, InFO, and system-on-integrated-chip packagingNot reportedNot reportedNot reported
3037Flip-chip substrates, high-density interconnect boards, and carrier boardsNot reportedNot reportedNot reported

08Assembly, test & inspection

Testing starts while the chips are still on the wafer. Probe equipment checks individual dies so manufacturers can avoid putting defective parts into an expensive package. After assembly, further tests check electrical behavior, speed, temperature tolerance, and reliability. Some failures appear only when the device runs as part of a system. The output of this layer is a qualified component, with results that can also guide changes to the design and manufacturing process.

Probe the waferIdentify usable diesTest the packageElectrical + thermal checksQualify the outputReady for the system
Probe the wafer
Identify usable dies
Test the package
Electrical + thermal checks
Qualify the output
Ready for the system
Wafer probing identifies usable dies; assembly, inspection, and final testing qualify the finished package. Schematic; not to scale.
Schematic · not to scale
1 / 5

Wafer probe

Automated test equipment and probe cards contact die on the wafer, map electrical results, and identify candidates worth packaging.

Advantest ↗

Test is a loop from wafer to system—not a single pass/fail gate

Advantest places test at design evaluation, wafer test, final test after packaging, and system-level test. Defect analysis feeds back toward design and production, making test data part of yield learning.

Advantest ↗

What's inside: 5 components and their sources
Wafer probedie touch · test second · wafer map

Automated test equipment and probe cards contact die on the wafer, map electrical results, and identify candidates worth packaging.

What to watch. Probe parallelism and test coverage must catch bad die without damaging pads or consuming excessive cycle time.

Stage: end of wafer processOutput: die mapAdvantest ↗

Dice + attachdie placed · bond · package

The wafer is separated into dies; selected logic, memory, and passive components are placed and bonded into the package flow.

What to watch. Handling loss, placement accuracy, particles, and bond defects can destroy value already accumulated in expensive known-good dies.

Input: known-good dieOutput: assembled packageAmkor Technology ↗

Final test + binningtest second · insertion · bin

Handlers move packaged devices through testers across temperatures; the test program sorts devices by function, speed, power, and quality grade.

What to watch. More coverage improves escape risk but adds test time. Thermal control and interface hardware must match high-power AI devices.

Stage: after packagingOutput: performance binAdvantest ↗

Burn-in + reliabilitydevice-hour · stress profile

Stress conditions accelerate latent failures and validate that package, interconnect, and silicon survive voltage and temperature margins.

What to watch. The screen must catch weak units without over-stressing good ones; reliability evidence matters for systems containing many high-value packages.

Stress: temperature + voltageGoal: screen latent faultsAdvantest ↗

System-level testsystem insertion · test minute

Devices are exercised in a board- or system-like environment to find interaction, firmware, memory, thermal, and high-speed I/O failures missed by isolated component tests.

What to watch. As packages become systems, fault coverage migrates upward. Watch correlation between component test and actual application failures.

Environment: application-likeFeedback: test → design + processAdvantest ↗

Market participants8 companies

Select a company for its roles, financials, relationships, and primary sources. Figures are company-wide USD for the fiscal year shown, not revenue attributable to this layer. Missing values are not reported.

CompanyRole in this layerRevenueCapexPP&E, net
6857High-speed test platforms for AI accelerators and HBMNot reportedNot reportedNot reported
AMKR · FY2025Assembly, wafer probe, final test, and system-level test$6.7B$904.6MNot reported
3711 / ASX · FY2025Wafer probe, final test, assembly, and system-level testNot reportedNot reportedNot reported
BESIHybrid bonding and die placement equipmentNot reportedNot reportedNot reported
6146Wafer singulation and thinning for advanced packagesNot reportedNot reportedNot reported
600584Package assembly and semiconductor test servicesNot reportedNot reportedNot reported
KLAC · FY2026Package, substrate, wafer, and reticle inspection$13.6B$375.9M$1.4B
TER · FY2025Wafer sort and packaged-device test systems$3.2B$224.0M$563.0M
Figure 2 · Financial intensity

Research intensity versus capital intensity

Latest fiscal year where revenue, R&D, and capital expenditures coexist. Bubble area follows company-wide revenue; ratios are derived from reported SEC XBRL facts.

0%15%30%45%60%0%13%25%38%50%CAPITAL EXPENDITURES / REVENUER&D / REVENUETower Semiconductor · FY2025 · R&D 5.5% · capex 28.4% · revenue $1.6BEntegris · FY2025 · R&D 10.3% · capex 9.4% · revenue $3.2BMicrochip Technology · FY2026 · R&D 23.0% · capex 1.9% · revenue $4.7BArm · FY2026 · R&D 56.4% · capex 11.1% · revenue $4.9BAmkor · FY2025 · R&D 2.5% · capex 13.5% · revenue $6.7BSynopsys · FY2025 · R&D 35.1% · capex 2.4% · revenue $7.1BCoherent · FY2026 · R&D 10.2% · capex 15.5% · revenue $7.1BMarvell · FY2026 · R&D 25.3% · capex 4.3% · revenue $8.2BNXP · FY2025 · R&D 19.2% · capex 3.2% · revenue $12.3BKLA · FY2026 · R&D 11.3% · capex 2.8% · revenue $13.6BTexas Instruments · FY2025 · R&D 11.8% · capex 25.7% · revenue $17.7BApplied Materials · FY2025 · R&D 12.6% · capex 8.0% · revenue $28.4BLinde · FY2025 · R&D 0.4% · capex 15.5% · revenue $34.0BAMD · FY2025 · R&D 23.4% · capex 2.8% · revenue $34.6BMicron · FY2025 · R&D 10.2% · capex 42.4% · revenue $37.4BIntel · FY2025 · R&D 26.1% · capex 27.7% · revenue $52.9BBroadcom · FY2025 · R&D 17.2% · capex 1.0% · revenue $63.9B

17 companies meet the strict same-year comparability rule. Click a bubble for the underlying fiscal year and filing source.

Financial facts ↗

Figure 3 · Manufacturing build-out

Nine tracked U.S. projects, with status kept explicit

City-level orientation only. A program can represent several announced facilities; cost is shown only when the cited source reports a comparable program value.

Tracked United States semiconductor manufacturing projectsA state-level map with five clickable city or metro clusters. Numbers show the projects in each cluster, and marker colors show project status.
announced / plannedunder constructionoperational / rampingNumber = projects grouped within 90 km. Click a marker for the underlying records.Map geometry: U.S. Census Bureau 2024 cartographic boundaries ↗
ProjectStatusScope & announced productsReported costPrimary source

Peoria, Arizona
under-constructionadvanced packaging and test campus
advanced packaging · semiconductor test
$7.00BAmkor Technology ↗

Chandler, Arizona
under-constructiontwo leading-edge logic fabs
leading-edge logic · foundry capacity
Not reportedNational Institute of Standards and Technology ↗

Boise, Idaho
under-constructionleading-edge memory fabs and R&D
DRAM · advanced memory
Not reportedMicron Technology ↗

Clay, New York
plannedmemory manufacturing campus
leading-edge DRAM
$100.00BNational Institute of Standards and Technology ↗

West Lafayette, Indiana
plannedadvanced packaging and R&D campus
HBM advanced packaging
$3.87BSK hynix ↗

Sherman, Texas
under-constructionanalog and embedded semiconductor fab campus
analog semiconductors · embedded processors
Not reportedNational Institute of Standards and Technology ↗

Phoenix, Arizona
operationalleading-edge logic fab
N4 logic wafers
Not reportedNational Institute of Standards and Technology ↗

Phoenix, Arizona
under-constructionleading-edge logic fab
N3 logic wafers
Not reportedNational Institute of Standards and Technology ↗

Phoenix, Arizona
announcedthree fabs, two advanced-packaging facilities, and R&D center
advanced logic · advanced packaging
$100.00BTSMC ↗
Figure 4 · Reported capital expenditure

Company-wide capex since 2017

Annual sum across covered issuers with a reported USD Company Facts value. The coverage set changes by year; this is not total industry capex.

$19.8B
2017
$31.0B
2018
$34.1B
2019
$30.3B
2020
$38.9B
2021
$50.0B
2022
$50.3B
2023
$48.8B
2024
$48.5B
2025
$2.5B
2026

Missing is not zero. Each bar sums only the 5–20 covered companies reporting in that year.

Open capex records ↗

Methodology and data access
Data access

One snapshot, two interfaces

The page, versioned HTTP API, and read-only MCP tools resolve against the same bundled snapshot. IDs are stable strings; pagination is deterministic; no interface recomputes facts from a second store.

Methodology & limits

Universe

54 current public companies selected for direct relevance across eight physical layers. Multiple membership is retained.

Financials

2017 onward, extracted from SEC Company Facts. Original unit, period, filing date, tag, source, and reported status are preserved.

Trade

V1 publishes a revision-labeled HTS heading codebook but no trade values. Headings 3818, 8486, 8541, and 8542 include products beyond advanced AI chips; an honest chart needs subheading concordance first.

Citation

MTS Intelligence, “The Supply Chain Behind Advanced AI Chips,” 2026-08-26, snapshot semiconductors-v1-9ec9a9512e4ae1d5.

Primary sources
Source register · evidence tier 1

Primary evidence used in V1

Company dossier

Role in the chain

    Latest reported financials

    Disclosed relationships

      Tracked projects

        Primary sources

          Project cluster